Standard portable
x-ray flaw detector

High frequency and high voltage x-ray flaw detector

• In 1964, Aolong developed China's first x-ray flaw detector.
  
  
• In 1965, Aolong developed China's first x-ray diffractometer and China's first crystal orientation instrument.
  
  
• In 1991, Aolong was ratified as “China's ray instrument base” by government.
  
  
• Aolong company is the national high technical industrialization demonstration base of x-ray real time imaging detecting system.
  
  
• Aolong company is the national high technical industrialization demonstration base of micro focus spot x-ray detecting system.
  
  
• X-ray real time imaging system is enlisted as the national key new products.
  
  
• X-ray diffractometer and x-ray fluorescence spectrum are ratified as one of the national Large-Scale Precision Instrument by the ministry of science and technology of people's Republic of China.
  
  
• X -ray real time imaging system is enlisted as the nation's high technical industrialization demonstration subject by the National Development and Reform Commission.
  
  
• The high energy x-ray flaw detector and the industry CT are enlisted as the national 11th five-year key plan.